This edition page records Condensed guide for the Stanford revision of the Binet-Simon intelligence tests, credited to Terman, Lewis M. (Lewis Madison), 1877-1956, within the Educational Theory collection at ukixu.com.

Edition profile

The extracted text contains approximately 14,345 words, corresponding to an estimated 63 minutes of reading, and is divided into 3 detectable text sections. These figures describe the downloaded text file rather than a printed pagination system.

The automated text analysis reports an average sentence length of about 14.1 words and a measured lexical-diversity value of 0.152. These measurements are descriptive reading aids, not literary ratings.

Catalog context

The source record associates this edition with the following subjects: Intelligence tests, Stanford-Binet Test, Binet-Simon Test. Catalog terms may reflect historical library practice and can be broader or narrower than a modern reader’s interpretation.

Using this page

Use the source link in the Edition facts box to compare the original catalogue record. The reading and text-structure figures can help estimate length, while the category and subject labels provide routes to related editions in this collection.